APA Citatie

Leach, R. (2014). Fundamental principles of engineering nanometrology (2nd ed.). Elsevier.

Chicago Style citaat

Leach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Amsterdam: Elsevier, 2014.

MLA citatie

Leach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Elsevier, 2014.

Let op: Deze citaties zijn niet altijd 100% accuraat.