Leach, R. (2014). Fundamental principles of engineering nanometrology (2nd ed.). Elsevier.
Style de citation ChicagoLeach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Amsterdam: Elsevier, 2014.
Style de citation MLALeach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Elsevier, 2014.
Attention : ces citations peuvent ne pas être correctes à 100%.