Leach, R. (2014). Fundamental principles of engineering nanometrology (2nd ed.). Elsevier.
Chicago Edition CitationLeach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Amsterdam: Elsevier, 2014.
Cita MLALeach, Richard. Fundamental Principles of Engineering Nanometrology. 2nd ed. Elsevier, 2014.
Atenció: Aquestes cites poden no estar 100% correctes.