Nalaganje...
Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy
| Glavni avtor: | |
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| Drugi avtorji: | |
| Format: | Printed Book |
| Jezik: | English |
| Izdano: |
Cochin:
Cochin University of Science and Techonology,
2004.
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| Teme: |
PHY
| Signatura: |
PH. D |
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| Kopija | Zaloga ni dosegljiva |