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Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy

Bibliografiske detaljer
Hovedforfatter: Paulraj, M.
Andre forfattere: Vijayakumar, K. P (Guide)
Format: Printed Book
Sprog:English
Udgivet: Cochin: Cochin University of Science and Techonology, 2004.
Fag:

PHY

Detaljer om beholdninger fra PHY
Klassifikationsnummer: PH. D
Kopi Live Status Unavailable