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Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy

Bibliografski detalji
Glavni autor:	Paulraj, M.
Daljnji autori:	Vijayakumar, K. P (Guide)
Format:	Printed Book
Jezik:	English
Izdano:	Cochin: Cochin University of Science and Techonology, 2004.
Teme:	Thin film

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