Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy

समान संसाधन

• Photothermal beam deflection for non-destructive evaluation of semiconductor thin films (Thesis)
  द्वारा: Anitha R Warrier
  प्रकाशित: (2010)
• Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
  द्वारा: Paulraj, M.
  प्रकाशित: (2004)
• Preparation and characterization of Ag2Se and AgInSe2 thin films: effects of electron irradiation and ion implantation
  द्वारा: Santhosh Kumar, M. C.
  प्रकाशित: (2002)
• Thin film physics
  द्वारा: Heavens, O. S.
  प्रकाशित: (1970)
• Thin film fundamentals
  द्वारा: Goswami, A
  प्रकाशित: (1996)