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Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy
| Príomhúdar: | Paulraj, M. |
|---|---|
| Údair Eile: | Vijayakumar, K. P (Guide) |
| Formáid: | Printed Book |
| Teanga: | English |
| Foilsithe: |
Cochin:
Cochin University of Science and Techonology,
2004.
|
| Ábhair: |
Míreanna Comhchosúla
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Photothermal beam deflection for non-destructive evaluation of semiconductor thin films (Thesis)
le: Anitha R Warrier
Foilsithe: (2010) -
Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
le: Paulraj, M.
Foilsithe: (2004) -
Preparation and characterization of Ag2Se and AgInSe2 thin films: effects of electron irradiation and ion implantation
le: Santhosh Kumar, M. C.
Foilsithe: (2002) -
Thin film physics
le: Heavens, O. S.
Foilsithe: (1970) -
Thin film fundamentals
le: Goswami, A
Foilsithe: (1996)