Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy

Παρόμοια τεκμήρια

• Photothermal beam deflection for non-destructive evaluation of semiconductor thin films (Thesis)
  ανά: Anitha R Warrier
  Έκδοση: (2010)
• Non-destructive evaluation of ion implanted semiconducfor thin films using photothermal deflection spectrosco
  ανά: Paulraj, M.
  Έκδοση: (2004)
• Preparation and characterization of Ag2Se and AgInSe2 thin films: effects of electron irradiation and ion implantation
  ανά: Santhosh Kumar, M. C.
  Έκδοση: (2002)
• Thin film physics
  ανά: Heavens, O. S.
  Έκδοση: (1970)
• Thin film fundamentals
  ανά: Goswami, A
  Έκδοση: (1996)