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| LEADER |
00635nam a22001697a 4500 |
| 005 |
20200810155452.0 |
| 008 |
110704t xxu||||| |||| 00| 0 eng d |
| 082 |
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|a PH. D
|
| 100 |
|
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|a Paulraj, M.
|9 9035
|
| 245 |
|
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|a Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy
|
| 300 |
|
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|a Ph. D
|
| 653 |
|
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|a Thin film
|
| 700 |
|
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|a Vijayakumar, K. P (Guide)
|9 8969
|
| 942 |
|
|
|c REF
|6 _
|
| 260 |
|
|
|a Cochin:
|b Cochin University of Science and Techonology,
|c 2004.
|
| 999 |
|
|
|c 215330
|d 215330
|
| 952 |
|
|
|0 0
|1 0
|2 ddc
|4 0
|6 PH_D
|7 0
|9 279104
|a PHY
|b PHY
|d 2011-07-18
|o PH. D
|p PHYD/0093
|r 2018-05-17
|w 2018-05-17
|y REF
|