Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy

Benzer Materyaller

• Photothermal beam deflection for non-destructive evaluation of semiconductor thin films (Thesis)
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  Yazar:: Heavens, O. S.
  Baskı/Yayın Bilgisi: (1970)
• Thin film fundamentals
  Yazar:: Goswami, A
  Baskı/Yayın Bilgisi: (1996)