एपीए उद्धरण

Paulraj, M., & Vijayakumar, K. P. (2004). Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy. Cochin University of Science and Techonology.

शिकागो स्टाइल उद्धरण

Paulraj, M., और K. P. Vijayakumar. Non-destructive Evaluation of Ion Implanted Semiconductor Thin Films Using Photothermal Deflection Spectroscopy. Cochin: Cochin University of Science and Techonology, 2004.

एमएलए उद्धरण

Paulraj, M., और K. P. Vijayakumar. Non-destructive Evaluation of Ion Implanted Semiconductor Thin Films Using Photothermal Deflection Spectroscopy. Cochin University of Science and Techonology, 2004.