Paulraj, M., & Vijayakumar, K. P. (2004). Non-destructive evaluation of ion implanted semiconductor thin films using photothermal deflection spectroscopy. Cochin University of Science and Techonology.
Styl ChicagoPaulraj, M., a K. P. Vijayakumar. Non-destructive Evaluation of Ion Implanted Semiconductor Thin Films Using Photothermal Deflection Spectroscopy. Cochin: Cochin University of Science and Techonology, 2004.
Citace podle MLAPaulraj, M., a K. P. Vijayakumar. Non-destructive Evaluation of Ion Implanted Semiconductor Thin Films Using Photothermal Deflection Spectroscopy. Cochin University of Science and Techonology, 2004.
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