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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Huvudupphovsman: | |
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| Övriga upphovsmän: | |
| Materialtyp: | Printed Book |
| Språk: | English |
| Publicerad: |
Cochin:
Cochin University of Science and Technology,
2004.
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| Ämnen: |
PHY
| Signum: |
PH. D |
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| Exemplar | Status otillgänglig |