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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Hoofdauteur: | |
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| Andere auteurs: | |
| Formaat: | Printed Book |
| Taal: | English |
| Gepubliceerd in: |
Cochin:
Cochin University of Science and Technology,
2004.
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| Onderwerpen: |
PHY
| Plaatsingsnummer: |
PH. D |
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| Kopie | Status is onbeschikbaar |