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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Autor Principal: | |
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| Outros autores: | |
| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
Cochin:
Cochin University of Science and Technology,
2004.
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| Subjects: |
PHY
| Número de Clasificación: |
PH. D |
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| Copia | Live Status Unavailable |