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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
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| Autres auteurs: | |
| Format: | Printed Book |
| Langue: | English |
| Publié: |
Cochin:
Cochin University of Science and Technology,
2004.
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| Sujets: |
PHY
| Cote: |
PH. D |
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| Exemplaire | Statut en temps réel indisponible |