Cargando...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Autor principal: | |
|---|---|
| Otros Autores: | |
| Formato: | Printed Book |
| Lenguaje: | English |
| Publicado: |
Cochin:
Cochin University of Science and Technology,
2004.
|
| Materias: |
PHY
| Número de Clasificación: |
PH. D |
|---|---|
| Copia | Estatus de actividad no disponible |