Wordt geladen...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Hoofdauteur: | |
|---|---|
| Andere auteurs: | |
| Formaat: | Printed Book |
| Taal: | English |
| Gepubliceerd in: |
Cochin:
Cochin University of Science and Technology,
2004.
|
| Onderwerpen: |