Llwytho...

Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Manylion Llyfryddiaeth
Prif Awdur: Rupa, R. Pai
Awduron Eraill: Sudha Kartha, C (Guide)
Fformat: Printed Book
Iaith:English
Cyhoeddwyd: Cochin: Cochin University of Science and Technology, 2004.
Pynciau:

Eitemau Tebyg