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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Prif Awdur: | Rupa, R. Pai |
|---|---|
| Awduron Eraill: | Sudha Kartha, C (Guide) |
| Fformat: | Printed Book |
| Iaith: | English |
| Cyhoeddwyd: |
Cochin:
Cochin University of Science and Technology,
2004.
|
| Pynciau: |
Eitemau Tebyg
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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
gan: Rupa R. Pai
Cyhoeddwyd: (2004) -
Thermally stimulated relaxation in solids /
Cyhoeddwyd: (1979) -
Semiconducting Transparent Thin Films
gan: Hartnagel,H L
Cyhoeddwyd: (1995) -
Semiconducting transparent thin films
gan: Hartnagel, H. L. [...et al]
Cyhoeddwyd: (1995) -
Semiconducting transparent thin films
gan: Hartnagel, H. L. [...et al]
Cyhoeddwyd: (1995)