Načítá se...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Hlavní autor: | |
|---|---|
| Další autoři: | |
| Médium: | Printed Book |
| Jazyk: | English |
| Vydáno: |
Cochin:
Cochin University of Science and Technology,
2004.
|
| Témata: |