Loading...
Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Printed Book |
| Language: | English |
| Published: |
Cochin:
Cochin University of Science and Technology,
2004.
|
| Subjects: |
PHY
| Call Number: |
PH. D |
|---|---|
| Copy | Live Status Unavailable |