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Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements

Bibliographic Details
Main Author: Rupa, R. Pai
Other Authors: Sudha Kartha, C (Guide)
Format: Printed Book
Language:English
Published: Cochin: Cochin University of Science and Technology, 2004.
Subjects:
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082 |a PH. D 
100 |a Rupa, R. Pai  |9 9034 
245 |a Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements 
300 |a Ph. D 
653 |a Thin films  |a Thermally stimulated current 
700 |a Sudha Kartha, C (Guide)  |9 8987 
942 |c REF  |6 _ 
260 |a Cochin:   |b Cochin University of Science and Technology,  |c 2004. 
999 |c 215329  |d 215329 
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