Rupa, R. P., & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Cochin University of Science and Technology.

Rupa, R. Pai, and C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Cochin: Cochin University of Science and Technology, 2004.

Rupa, R. Pai, and C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Cochin University of Science and Technology, 2004.