Citazione APA

Rupa, R. P., & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Cochin University of Science and Technology.

Stile di citazione Chicago

Rupa, R. Pai, e C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Cochin: Cochin University of Science and Technology, 2004.

Citazione MLA

Rupa, R. Pai, e C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Cochin University of Science and Technology, 2004.