Rupa, R. P., & Sudha Kartha, C. (2004). Analysis and identification of traps in some binary semiconducting thin films using thermally stimulated current measurements. Cochin University of Science and Technology.
Chicago Edition CitationRupa, R. Pai, and C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Cochin: Cochin University of Science and Technology, 2004.
MLA Edition CitationRupa, R. Pai, and C. Sudha Kartha. Analysis and Identification of Traps in Some Binary Semiconducting Thin Films Using Thermally Stimulated Current Measurements. Cochin University of Science and Technology, 2004.
Warning: These citations may not always be 100% accurate.