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The electrical characterization of semiconductors : measurement of minority carrier properties
| Autor Principal: | |
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| Outros autores: | |
| Formato: | Printed Book |
| Idioma: | English |
| Publicado: |
New York:
Academic Press,
1990
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| Series: | Techniques of physics;
13 |
| Subjects: |
PHY
| Número de Clasificación: |
621.381/52 ORT |
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| Copia | Live Status Unavailable |