Structure and properties of thin films; proceedings.

Bibliographic Details
Corporate Author: International Conference on Structure and Properties of Thin Films Bolton Landing, N.Y.
Other Authors: Neugebauer, C. A., ed
Format: Printed Book
Language:English
Published: New York, Wiley [c1959]
Subjects:
Thin films > Congresses

PHY

Holdings details from PHY
Call Number: 541.3453 STR*
Copy Live Status Unavailable

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