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Structure and properties of thin films; proceedings.

Bibliographic Details
Corporate Author: International Conference on Structure and Properties of Thin Films Bolton Landing, N.Y.
Other Authors: Neugebauer, C. A., ed
Format: Printed Book
Language:English
Published: New York, Wiley [c1959]
Subjects:
Description
Physical Description:xiv, 561 p. illus., group port. 29 cm.