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00672cam a2200181 a 4500 |
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20200810153322.0 |
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971216s1998 nyua b 001 0 eng |
| 082 |
0 |
0 |
|a 621.3815/2
|b SCH
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| 100 |
1 |
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|a Schroder, Dieter K.
|9 5508
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| 245 |
0 |
0 |
|a Semiconductor material and device characterization /
|c Dieter K. Schroder.
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| 250 |
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|a 2nd ed.
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| 300 |
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|a xxiv, 760 p. :
|b ill. ;
|c 25 cm.
|
| 653 |
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|a Semiconductors
|a Semiconductors--Testing
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| 942 |
|
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|c BK
|6 _
|
| 260 |
|
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|a New York :
|b Wiley,
|c c1998.
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| 020 |
|
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|a 0471241393
|
| 999 |
|
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|c 213439
|d 213439
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| 952 |
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|0 0
|1 0
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|6 62138152_SCH
|7 0
|9 272060
|a PHY
|b PHY
|d 2010-03-06
|l 7
|m 1
|o 621.3815/2 SCH
|p PHY012386
|r 2020-01-07
|s 2018-06-30
|w 2010-03-06
|y BK
|