Semiconductor material and device characterization /

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Bibliographic Details
Main Author: Schroder, Dieter K.
Format: Printed Book
Language:English
Published: New York : Wiley, c1998.
Edition:2nd ed.
Subjects:
Semiconductors > Semiconductors--Testing
Description
Physical Description:xxiv, 760 p. : ill. ; 25 cm.
ISBN:0471241393

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