Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
Chicago Style citaatSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
MLA citatieSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
Let op: Deze citaties zijn niet altijd 100% accuraat.