Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
シカゴスタイル引用形Schroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
MLA引用形式Schroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
警告: この引用は必ずしも正確ではありません.