Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
Stile di citazione ChicagoSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
Citazione MLASchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
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