Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
Čikaški stil citiranjaSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
MLA način citiranjaSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
Upozorenje: Ovi citati možda nisu uvijek 100% točni.