Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
Style de citation ChicagoSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
Style de citation MLASchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
Attention : ces citations peuvent ne pas être correctes à 100%.