Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
Chicago ZitierstilSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
MLA ZitierstilSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.