Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
Chicago Edition CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
MLA引文Schroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
警告:這些引文格式不一定是100%准確.