Schroder, D. K. (1998). Semiconductor material and device characterization (2nd ed.). Wiley.
Chicago Edition CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. New York: Wiley, 1998.
MLA Edition CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 2nd ed. Wiley, 1998.
Warning: These citations may not always be 100% accurate.