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00993cam a2200217 i 4500 |
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20200810153321.0 |
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810112s1981 nyua b 101 0 eng |
| 082 |
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|a 537.6/22
|b NAR
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| 245 |
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|a Defects in semiconductors :
|b proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A. /
|c editors, J. Narayan and T. Y. Tan.
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| 300 |
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|a xi, 537 p. :
|b ill. ;
|c 24 cm.
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| 490 |
1 |
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|a Materials Research Society symposia proceedings ;
|v v. 2
|x 0272-9172
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| 653 |
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|a Semiconductors--Defects--Congresses.
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| 700 |
1 |
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|a Narayan, J., ed.
|9 5732
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| 700 |
1 |
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|a Tan, T. Y., ed.
|9 5733
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| 710 |
2 |
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|a Materials Research Society.
|9 3063
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| 942 |
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|c BK
|6 _
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| 260 |
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|a New York :
|b North Holland,
|c c1981.
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| 020 |
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|a 044400596X
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| 830 |
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0 |
|a Materials Research Society symposia proceedings ;
|v v. 2.
|9 5734
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| 999 |
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|c 213438
|d 213438
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| 952 |
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|d 2010-08-11
|o 537.6/22 NAR
|p PHY007584
|r 2018-05-17
|w 2018-05-17
|y BK
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