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QR Kod

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. /

Detaylı Bibliyografya
Diğer Yazarlar:	Mahajan, Subhash., ed, Corbett, James W., ed
Materyal Türü:	Printed Book
Dil:	English
Baskı/Yayın Bilgisi:	New York : North-Holland, c1983.
Seri Bilgileri:	Materials research society symposia proceedings;
Konular:	Semiconductors > Defects > Congresses.

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