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Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A. /

书目详细资料
其他作者: Mahajan, Subhash., ed, Corbett, James W., ed
格式: Printed Book
语言:English
出版: New York : North-Holland, c1983.
丛编:Materials research society symposia proceedings;
主题:
实物特征
实物描述:xv, 582 p. : ill. ; 24 cm.
ISBN:0444008128
ISSN:v. 14