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| LEADER |
00643cam a2200181 i 4500 |
| 005 |
20200810153300.0 |
| 008 |
741022s1974 enka b 001 0 eng |
| 082 |
0 |
0 |
|a 621.3815/2
|b JOW
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| 100 |
1 |
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|a Jowett, C. E.
|9 4479
|
| 245 |
1 |
0 |
|a Semiconductor devices :
|b testing and evaluation /
|c [by] C. E. Jowett.
|
| 300 |
|
|
|a [ix], 134 p. :
|b ill. ;
|c 24 cm.
|
| 653 |
|
|
|a Semiconductors--Testing
|
| 942 |
|
|
|c BK
|6 _
|
| 260 |
|
|
|a London :
|b Business Books,
|c 1974.
|
| 500 |
|
|
|a Includes index.
|
| 020 |
|
|
|a 0220662215 :
|
| 999 |
|
|
|c 213403
|d 213403
|
| 952 |
|
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|0 0
|1 0
|2 ddc
|4 0
|6 62138152_JOW
|7 0
|9 272009
|a PHY
|b PHY
|d 2010-03-06
|o 621.3815/2 JOW
|p phy006133
|r 2018-05-17
|w 2018-05-17
|y BK
|