Carregant...

Codi QR

Principles of semiconductor network testing /

Dades bibliogràfiques
Autor principal:	Afshar, Amir
Format:	Printed Book
Idioma:	English
Publicat:	Boston : Butterworth-Heinemann, c1995.
Matèries:	Integrated circuits--Testing. > Semiconductors--Testing.

Ítems similars

Semiconductor devices : testing and evaluation /
per: Jowett, C. E.
Publicat: (1974)

Semiconductor material and device characterization /
per: Schroder, Dieter K.
Publicat: (1998)

Random testing of digital circuits: theory and applications
per: David, Rene; Author
Publicat: (1998)

Integrated Circuits and Semiconductor Devices: Theory and Application
per: Deboo,Gordon J.
Publicat: (1977)

Semiconductor circuit approximations: an introduction to transistors and integrated circuits
per: Malvino, Albert Paul
Publicat: (1986)

VLSI test principles and architectures: design for testability
per: Wang, laung-Terng [ed.]
Publicat: (2006)

System-on-chip test architectures: nanometer design for testability
per: Wang, Laung-Terng
Publicat: (2008)

Semiconductor circuit approximations
per: Malvino, Albert Paul
Publicat: (1985)

Device electronics for integrated circuits /
per: Muller, Richard S.
Publicat: (1977)

Electronic circuits : design and applications /
per: Tietze, U.
Publicat: (1991)

Solid-state devices and integrated circuits /
per: Cooper, William David
Publicat: (1982)

The Semiconductor Integrated Circuits Layout-Design Act, 2000
per: Bare Act
Publicat: (2015)

Essentials of semiconductor circuits
per: Hess, Edward M
Publicat: (1976)

Nondestructive testing handbook;v.4 electromagnetic testing
Publicat: (1986)

Defects in microelectronic materials and devices
per: Fleetwood, Daniel M.
Publicat: (2009)

Essentials of phychological testing
per: Cronbach, Lee J
Publicat: (1949)

Phychological testing
per: Anastasi, Anne
Publicat: (1988)

Psychological testing
per: Anastasi, Anne
Publicat: (1976)

Psychological Testing
per: Anastasi,Anne
Publicat: (1976)

Ultrasonic testing: non conventional testing techniques
per: Szilard, J
Publicat: (1982)

Handbook of semiconductor lasers and photonic integrated circuits
per: Suematsu [ed.]
Publicat: (1994)

Understanding plastics testing
per: Hytton, Donald C.
Publicat: (2004)

Managing the testing process /
per: Black, Rex .
Publicat: (1999)

100 Statistical Tests
per: Gopal K Kanji
Publicat: (2006)

Language testing and assessment
per: Clapham, Caroline; Editor, et al.
Publicat: (1997)

Essentials of psychological testing
per: Cronbach, Lee J
Publicat: (1984)

IQ and personality tests
per: Carter, Philip
Publicat: (2008)

Laboratory testing of soils, rocks and aggregates
per: Sivakugan
Publicat: (2014)

Testing psychological tests
per: Cohen, David, et al.
Publicat: (1986)

Semiconductors: physics, devices, and circuits
per: Cirovic, Michael M.
Publicat: (1971)

Nondestructive testing handbook;v.5acoustic emission testing
per: Miller, Ronnie K.
Publicat: (1987)

Psychological testing and assessment
per: Aiken, Lewis R; Author
Publicat: (2003)

Electrical and magnetic methods of non-destructive testing /
per: Blitz, Jack
Publicat: (1997)

Theory and practice of psychological testing
per: Freeman, Frank S
Publicat: (1962)

Psychological testing: History, Principles, and Applications /
per: Gregory,, Robert J.
Publicat: (2007)

Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A. /
Publicat: (1986)

Test of reasoning /
per: Thorpe, Edgar
Publicat: (2014)

Biochemical tests : principles and protocols /
per: Anil Kumar
Publicat: (2015)

Software testing: principles and practices
per: Desikan, Srinivasan
Publicat: (2012)

Diode lasers and photonic integrated circuits /
per: Coldren, L. A.
Publicat: (1995)