rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Principles of semiconductor network testing
  name:
    name part: Afshar, Amir.
    role:
      role term: creator
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: mau
    place:
      place term: Boston
    publisher: Butterworth-Heinemann
    date issued: c1995
    date issued: 1995
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xiv, 213 p. : ill. ; 25 cm.
  note: Amir Afshar.
  subject:
    topic: Integrated circuits--Testing.
    topic: Semiconductors--Testing.
  classification: 621.3815/48 AFS
  identifier: 0750694726
  record info:
    record creation date: 950317
    record change date: 20200810153246.0