Principles of semiconductor network testing /

Bibliographic Details
Main Author: Afshar, Amir
Format: Printed Book
Language:English
Published: Boston : Butterworth-Heinemann, c1995.
Subjects:
Integrated circuits--Testing. > Semiconductors--Testing.

PHY

Holdings details from PHY
Call Number: 621.3815/48 AFS
Copy Live Status Unavailable

Similar Items