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| LEADER |
00642cam a2200169 a 4500 |
| 005 |
20200810153246.0 |
| 008 |
950317s1995 maua b 001 0 eng |
| 082 |
0 |
0 |
|a 621.3815/48
|b AFS
|
| 100 |
1 |
|
|a Afshar, Amir.
|9 5632
|
| 245 |
1 |
0 |
|a Principles of semiconductor network testing /
|c Amir Afshar.
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| 300 |
|
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|a xiv, 213 p. :
|b ill. ;
|c 25 cm.
|
| 653 |
|
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|a Integrated circuits--Testing.
|a Semiconductors--Testing.
|
| 942 |
|
|
|c BK
|6 _
|
| 260 |
|
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|a Boston :
|b Butterworth-Heinemann,
|c c1995.
|
| 020 |
|
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|a 0750694726
|
| 999 |
|
|
|c 213367
|d 213367
|
| 952 |
|
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|0 0
|1 0
|2 ddc
|4 0
|6 621381548_AFS
|7 0
|9 271971
|a PHY
|b PHY
|d 2010-03-05
|o 621.3815/48 AFS
|p phy012641
|r 2018-05-17
|w 2018-05-17
|y BK
|