Principles of semiconductor network testing /

Bibliografski detalji
Glavni autor: Afshar, Amir
Format: Printed Book
Jezik:English
Izdano: Boston : Butterworth-Heinemann, c1995.
Teme:
Integrated circuits--Testing. > Semiconductors--Testing.
Opis
Opis:xiv, 213 p. : ill. ; 25 cm.
ISBN:0750694726

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