Principles of semiconductor network testing /

Bibliographic Details
Main Author: Afshar, Amir
Format: Printed Book
Language:English
Published: Boston : Butterworth-Heinemann, c1995.
Subjects:
Integrated circuits--Testing. > Semiconductors--Testing.
Description
Physical Description:xiv, 213 p. : ill. ; 25 cm.
ISBN:0750694726

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