載入...
Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /
| 企業作者: | |
|---|---|
| 其他作者: | , |
| 格式: | Printed Book |
| 語言: | English |
| 出版: |
Bristol ;
Institute of Physics Pub.,
1998.
|
| 叢編: | Institute of physics series;
no. 160 |
| 主題: |
PHY
| 索引號: |
621.3815/2 DON |
|---|---|
| 復印件 | Live Status Unavailable |