Defect recognition and image processing in semiconductors 1997 : proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997 /

Detaylı Bibliyografya
Müşterek Yazar: International Conference on Defect Recognition and Image Processing in Semiconductors Templin, Germany
Diğer Yazarlar: Donecker, J., ed, Rechenberg, I., ed
Materyal Türü: Printed Book
Dil:English
Baskı/Yayın Bilgisi: Bristol ; Institute of Physics Pub., 1998.
Seri Bilgileri:Institute of physics series; no. 160
Konular:
Semiconductors--Defects--Congresses. > Image processing--Congresses.

PHY

Detaylı Erişim Bilgileri PHY
Yer Numarası: 621.3815/2 DON
Kopya Bilgisi Konumu erişilebilir değil.

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